International Publications (2000)

  1. Silva, A. N. R., Morimoto, N. I., Bonnaud, O.; Tetraethylorthosilicate SiO2 films deposited at low temperature. Microelectronic Reliability. England, v.40, p.621 - 624, 2000.
  2. Toquetti, L. Z., Santos Filho, S. G.; A New Experimental Procedure to Obtain the Refractive Index of MOS Gate Oxynitrides Grown by RTP in N2O Atmosphere In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade da Amazônia - Imprensa Universitária, 2000; v.1. p.292 – 297
  3. Souza Filho, J. C., Santos Filho, S. G.; Analysis of the Surface Roughness and Surface Particle Concentration Using a New Technique: Integrated Angle Resolved LASER Scattering (IARLS) In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade do Amazonas - Imprensa Universitária, 2000; v.1. p.256 – 261
  4. Navia, A. R., Sonnenberg, V., Marques, A. E. B., Santos Filho, S. G., Martino, J. A.; Electrical Characterization of Thin Nickel Films Obtained from Electroless Plating onto Aluminum Gate of MOS Capacitores In: XV International Conference on Microelectronics and Packaging, 2000, Manaus; Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade da Amazônia - Imprensa Universitária, 2000; v.1. p.286 – 291
  5. Araújo, H. P., Santos Filho, S. G.; Electrical Simulations of Gate-Controlled Diodes in Order to Show their Feasibility as Luminous Radiation Sensors In: XV International Conference on Microelectronics and Packaging, 2000, Manaus; Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade do Amazonas - Imprensa Universitária, 2000; v.1. p.147 – 152
  6. Marques, A. E. B., Santos Filho, S. G.; Morphological Characterization of Electroless Nickel Films onto Aluminum Surfaces In: XV International Conference on Microelectronics and Packaging, 2000, Manaus; Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade da Amazônia - Imprensa Universiária, 2000; v.1. p.245 – 249
  7. Nogueira, W. A., Santos Filho, S. G.; Partial Dielectric Breakdown in MOS Gate Oxide Grown by RTO In: XV International Conference on Microelectronics and Packaging, 2000, Manaus; Proceedings of the XV International Conference on Microelectronics and Packaging. Manaus: Universidade do Amazonas - Imprensa Universitária, 2000; v.1. p.298 - 302
  8. Fontes, M. B. A., Marques, A. E. B., Santos Filho, S. G.; Development of a Highly Sensitive Chemical Microsensor In: Second IberoAmerican Conference on Sensors (Ibersensors 2000), 2000, Argentina; Proceendings of the Second IberoAmerican Conference on Sensors (Ibersensors 2000); 2000; v.1. p.68 - 69.
  9. Seabra, A. C.; A Modern Approach to Teaching Basic Experimental Electricity and Electronics. IEEE Transactions on Education, v.44, n.01, p.5 - 15, 2000.
  10. Seabra, A. C.; Production and Characterization of a Thick Film of PMMA for Application in Integrated Microoptics In: XVI International Conference on Microelectronics and Packaging, 2000, Pirenópolis; Proc. of the XVI International Conference on Microelectronics and Packaging, 2001. p.236 – 238
  11. Seabra, A. C.; Fabrication of microlenses with a Novolak-type polymer In: 6th International Conference on Frontiers of Polymers and Advanced Materials, 2000, Recife; Proceedings of the 6th International Conference on Frontiers of Polymers and Advanced Materials, 2000. p.246
  12. Seabra, A. C.; Increasing the optical efficiency of planar photodetectors: electron bem writing of an integrated microlens array on top of a MSM device In: Optics in Computing 2000, 2000, Quebec; Proceedings of the SPIE - Optics in Computing 2000, 2000. v.4089. p.890 – 894.
  13. Rodriguez, E. C., Ramirez, J.; Circuito de procesamiento de señal para medidores de presión intracorporea. In: Primer Congresso de Ingenieria Hospitalaria 2000, 2000, La Habana; 2000.
  14. Rodriguez, E. C., Gongora, M.; Electro-magnetic micro-valve using LTCC Technology In: XV SBMICRO International Conference on Microelectronics and packaging ICMP 2000, 2000, Manaus; Proceedings of SBM2000, 2000. p.189 – 192
  15. Rodriguez, E. C., Prieto, P.; Estudio y diseño de um sensor de presión para aplicaciones em angioplastia. In: Primer congresso de Ingenieria Hospitalaria 2000, 2000, La Habana; 2000.
  16. Nicolett, A. S.; Martino, J. A.; Simões, E.; Claeys, C. A New Method to Extract the LDD Doping Concentration on Fully Depleted SOI nMOSFET at 300 K. In: Third International Caracas Conference on Devices, Circuits and Systems (ICCDCS 2000), 2000, Cancún. Third International Caracas Conference on Devices, Circuits and Systems (ICCDCS 2000). 2000.
  17. Nicolet, A. S.; Martino, J. A.; Simões, E.; Claeys, C. A New Method to Extract the Silicon Film Thickness of Enhancement-Mode Fully Depleted SOI MOSFETs. In: First IEEE Latin American Test Workshop LATW'00, 2000, Rio de Janeiro. First IEEE Latin American Test Workshop LATW'00. 2000. p. 264-267.
  18. Bellodi, M.; Martino, J. A. Analysis of the Leakage Drain Current in Accumulation-Mode SOI pMOSFETs Operating up to 300oC. In: First IEEE Latin American Test Workshop LATW'00, 2000, Rio Janeiro. First IEEE Latin American Test Workshop LATW'00. 2000. p. 268-273.
  19. Pavanello, M. A.; Martino, J. A.; Flandre, D. Comparison of Analog Performance in Conventional and Graded-Channel Fully-Depleted SOI MOSFETs. In: XV Internationa Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 67-71.
  20. Pavanello, M.; Martino, J. A.; Flandre, D. Comparison of Floating-body Effects in Conventional and Graded-channel Fully-depleted Silicon-on-insulator nMOSFETs. In: Third International Caracas Conference on Devices, Circuits and Systems (ICCDCS 2000), 2000, Cancún. Third International Caracas Conference on Devices, Circuits and Systems (ICCDCS 2000). 2000.
  21. Sonnenberg, V.; Martino, J. A. Determination of Oxide Charge Density at the Gate Oxide/Silicon Film Interface in SOI-MOS Capacitor. In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 208-212.
  22. Sonnenberg, V.; Martino, J. A. Determination of the Silicon Film Thickness in SOI Capacitor. In: First IEEE Latin American Test Workshop LATW'00, 2000, Rio de Janeiro - RJ. First IEEE Latin American Test Workshop LATW'00. 2000. p. 181-184.
  23. Bellodi, M.; Iniguez, B; Flandre, D.; Martino, J. A. Diodes Model for the Leakage Drain Current in Enhancement-Mode SOI nMOSFETs at 300oC. In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 203-207.
  24. Pavanello, M. A.; Nicolett, A. S.; Martino, J. A. Effective Channel Length and Series Resistance Extraction Error Induced by the Substrate in Enhancement-Mode Soi nMOSFETs. In: First IEEE Latin American Test Workshop LATW'00, 2000, Rio de Janeiro. First IEEE Latin American Test Workshop LATW'00. 2000. p. 274-278.
  25. Nicolett, A. S.; Martino, J. A.; Simões, E.; Claeys, C. Extraction of the Silicon Film Thickness on Fully Depleted SOI nMOSFETs Using the Back Gate Voltage Influence. In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 103-107.
  26. Pavanello, M. A.; Martino, J. A.; Flandre, D. Parasitic Bipolar Effects in Graded-Channel Fully-Depleted Silicon-On-Insulator nMOSFET. In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 97-102.
  27. Bellodi, M.; Iniguez, B; RAYNAUD, C; Flandre, D.; Martino, J. A. Study of the Deep-Submicron SOI MOSFETs Leakage Current Behvior at High-Temperatures. In: XV International Conference on Microelectronics and Packaging, 2000, Manaus. XV International Conference on Microelectronics and Packaging. 2000. p. 304-307.
  28. Pavanello, M. A.; Martino, J. A.; Dessard, V. An Asymmetric Channel SOI nMOSFET for Reducing Parasitic Effects and Improving Output Characteristics. Electrochemical And Solid State Letters, v. 3, n. 1, p. 50-52, 2000.
  29. Pavanello, M. A.; Martino, J. A.; Dessard, Vicent; Flandre, D. Analog Performance and Application of Graded-Channel Fully Depleted SOI MOSFETs. Solid State Electronics, England, v. 44, p. 1219-1222, 2000.
  30. Nicolett, A. S.; Martino, J. A.; Simões, E.; Claeys, C. Extraction of the Lightly Doped Drain Concentration of Fully Depleted SOI NMOSFETs Using the Back Gate Bias Effect. Solid State Electronics, England, v. 44, p. 677-684, 2000.
  31. Pavanello, M. A.; Martino, J. A.; Flandre, D. Graded-Channel Fully Depleted Silicon-On-Insulator nMOSFET for Reducing the Parasitic Bipolar Effects. Solid State Electronics, Inglaterra, v. 44, p. 917-922, 2000.
  32. Nicolett, A. S.; Martino, J. A.; Simões, E.; Claeys, C. Simultaneous Extraction of the Silicon Film and Front Oxide Thicknesses on Fully Depleted SOI NMOSFETs. Solid State Electronics, v. 44, p. 1961-1969, 2000.
  33. Massi, M.; Urruchi, W I; Maciel, H. S.; Otani, C; Mansano, R. D. Application of a low intensity plasma beam system for etching process. In: International Conference on Microelectronics and Packaging, 2000, Manaus. Anais. 2000. p. 353-355.
  34. Zambom, L. da S.; Mansano, R. D.; Furlan, R. Characteristics of silicon nitride films deposited by inductively coupled plasma. In: International Conference on Microelectronics and Packaging, 2000, Manaus. Anais. 2000. p. 315-318.
  35. Cardona, P S P; Cirino, G. A.; Mansano, R. D.; Verdonck, P.; Gonçalves Neto, L. Complex-amplitude modulation diffractive optical element performed by aperture on a reflective aluminium layer deposited over a variable thickness SiO2 substrate. In: Difractive Optics and Micro-Optics, 2000, Quebec. Proceedings. 2000. p. 159-161.
  36. Massi, M.; Maciel, H. S.; Mansano, R. D.; Verdonck, P. Electrical and structural characterisation of DLC films deposited by magnetron sputtering. In: 3rd. International Conference on Materials For Microelectronics, 2000, Dublin Castle; Proceedings. 2000. p. 239-242.
  37. Cirino, G. A.; Mansano, R. D.; Verdonck, P.; Lichti, P A; Stefani, M A; Gonçalves Neto, L. Fabrication of Modulation Parabolic surface relief array using a silicon-based wet etch micromachining. In: Diffractive Optics and Micro-Optics, 2000, Quebec. Proceedings. 2000. p. 25-27.
  38. Fontes, M B; Furlan, R.; Aviles, J J Santiago; Mansano, R. D. Fabrication of silicon probes for biosensors. In: International Conference on Microelectronics and Packaging, 2000, Manaus. Proceedings. 2000. p. 142-146.
  39. Jaramillo, J. O.; Mansano, R. D. Amorphous hidrogenated carbon films: a new possibility in constructing of sensors. In: IBERSENSOR 2000, 2000, Buenos Aires. Proceedings. 2000. p. 46-46.
  40. Oliveira, I C; Massi, M.; Mansano, R. D.; Maciel, H. S.; Otani, C. Dielectric characterizatics of AlN films grown by dc-magnetron sputtering discharge. In: 11TH European Conference on Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide, 2000, Porto. Proceedings. 2000. p. 5.807-5.807.
  41. Jaramillo, J. O.; Mansano, R. D.; Zambom, L. da S.; Massi, M.; Maciel, H. S. Wet etching of hydrogenated amorphous carbon films. In: 11TH European Conference on Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide, 2000, Porto. Proceedings. 2000. p. 5.515-5.515.
  42. Mansano, R. D.; Verdonck, P.; Simões, E. W.; Furlan, R. Application of fluorine based plasma etching processes in microfluidic device fabrication. Journal of Solid State Devices and Circuits, Brasil, v. 8, n. 1, p. 5-9, 2000.
  43. Mansano, R. D.; Massi, M.; Zambom, L. da S.; Verdonck, P.; Nogueira, P. M.; Maciel, H. S.; Otani, C. Effects of methane content on the characteristics of diamond like carbon films produced by sputtering. Thin Solid Films, Inglaterra, v. 373, p. 243-246, 2000.
  44. Castro, R. M. de; Verdonck, P.; Pisani, M. B.; Mansano, R. D.; Cirino, G. A.; Maciel, H. S.; Massi, M. End-Point detection of polymer etching using Langmuir probes. Corrosion Science, v. 28, n. 3, p. 1043-1043, 2000.
  45. Mansano, R. D.; Massi, M.; Patrick Verdonck; Maciel, H. S.; Cirino, G. A.; Castro, R. M.; Pisani, M. B. Performance characterization of an RIE reactor with build-in RF excitation antenna. Journal of Solid State Devices and Circuits, Brasil, v. 8, n. 1, p. 1-4, 2000.
  46. Souza, S. G. de, Silva, M. L. P., Furlan, R. Micromechanical strucutres development to concentrate hydrocarbons from air. In: SBMICRO 2000 - XV International Conference on Microelectronics and Packaging. Manaus, 2000, Manaus. Proceedings of SBMicro 2000 - XV International Conference on Microelectronics and Packaging. Manaus: SBMicro, 2000. p.360-362.
  47. Pereira, G. J., Silva, M. L. P., Tan, I. H., Gouvea, D. Modification of surface properties of alumina by plasma treatment. Journal of Materials Chemistry, England, v.10, p.259-261, 2000.
  48. Nogueira, S., Silva, M. L. P. Caracterização de filmes obtidos a partir da deposição por plasma de hexametildissilazana. Journal of Solid State Devices and Circuits, São Paulo, v.8, n.1, p.28-28, 2000.
  49. Massi, M., Mansano, R. D., Verdonck, P., Maciel, H. S., Castro, R. M., Pisani, M. B., “Performance characterization of an RIE reactor with built-in RF excitation antenna”, Journal of Solid-State Devices and Circuits, vol. 8, pp 1-4 (2000).
  50. Castro, R. M., Verdonck, P., Pisani, M. B., Mansano, R. D., Cirino, G. A., Maciel, H. S., Massi, M., “End-point detection of polymer etching using Langmuir probes”, IEEE Transactions on Plasma Science, vol 28, pp 1043-1049 (2000).
  51. Verdonck, P., Goodyear, A., Mansano, R. D., Barroy, P. R. J., Braithwaite, N. St. J., “A new mechanism for silicon etching with fluorine based plasmas”, SBMICRO 2000, XV International Conference on Microelectronics and Packaging, pp 281-285, Manaus, AM, 2000
  52. Pisani, M. B., Verdonck, P., “RF electrical measurements in plasma processing reactors” SBMICRO 2000, XV International Conference on Microelectronics and Packaging, pp 348-351, Manaus, AM, 2000
  53. Verdonck, P. B., Barroy, P. R. J., Goodyear, A., Braithwaite, N. St. J., “On the anisotropy of plasma etching of silicon in pure SF6”, Abstract book of The Physics Conference (IOP), 2000, Brighton, England, p. 15, março 2000
  54. Barroy, P. R. J., Verdonck, P. B., Goodyear, A., Braithwaite, N. St. J., “Measurements of positive ion flux in electronegative plasmas”, Abstract book of The Physics Conference (IOP), 2000, Brighton, England, p. 14 março 2000
  55. Simões, E. W., Furlan, R. and Choi, D. H., “Microfluidic devices for gas flow control”, proceedings (CD-ROM) de FLOMEKO 2000 - The 10th International Conference on Flow Measurement, Salvador, Bahia, Brazil, Section "New Technologies and Devices", 2000, paper I5.
  56. Guimarães, M. S. and Furlan, R., "Analysis of microbeam deflection due to capillary loading", Proceedings of the XV International Conference on Microelectronics and Packaging (SBMicro 2000), Manaus, AM, 2000, pp. 363-366.
  57. Rodrigues, R. J. and Furlan, R., "Design and Implementation of a flow microsensor by using microelectronics technology", Proceedings of the XV International Conference on Microelectronics and Packaging (SBMicro 2000), Manaus, AM, pp. 390-393.
  58. Simões, E. W., Furlan, R. and Choi, D. H., "Microfluidic devices for liquid flow control", Proceedings of the XV International Conference on Microelectronics and Packaging (SBMicro 2000), Manaus, AM, pp. 356-359.
  59. Leminski, R., Fontes, M. B. A. and Furlan, R., "Mechanical simulation of silicon microprobes", Proceedings of the XV International Conference on Microelectronics and Packaging (SBMicro 2000), Manaus, AM, pp. 343-345.
  60. Simões, E. W., Furlan, R. and Choi, D. H., "Flow based characterization of the operation of a microfluidic amplifier", Proceedings of the "Heat Transfers and Transport Phenomena in Microsystems", Banff, Canada, 2000.
  61. Fontes, M. B. A., Marques, A. E. B., Furlan, R., Santos Filho, S. G. and Aviles, J. J. S., "Development of a highly sensitive chemical microsensor", Ibersensors 2000, 2nd IberoAmerican Conference on Sensors, Buenos Aires, Argentine, 2000, pp.68-69.
  62. Simões, E. W., Furlan, R., Ocampo, J. J. and Choi, D. H., "Project of Microdevices for Fluid Flow Control", Ibersensors 2000, 2nd IberoAmerican Conference on Sensors, Buenos Aires, Argentina, 2000, pp.110-111.

 
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