International Publications (1992)
"The Impact of Si/SiO2 Interface Asperities in Breakdow Characteristics of Thin Gate Oxides", M.C.V. Lopes, C.M. Hasenack, Journal E. Society vol. 139, nº 10, outubro 1992, pags. 2909-2912.
DMI Home Page
Index of Publications
DMI Home Page